Self-biased charge pump

ABSTRACT

An apparatus including: a current source configured to generate current; a switching current source circuit coupled to the current source and a first bias node to allow the current to flow through the switching current source circuit into the first bias node; a first bias circuit configured to receive a first control signal from a phase detector, the first bias circuit configured to mirror the current flowing through the switching current source circuit in response to the first control signal; a second bias circuit coupled to the first bias circuit at an output node and a second bias node, the second bias circuit configured to receive a second control signal from the phase detector; and a transconductance amplifier configured to receive a feedback signal from the output node and generate an output current to control the second biasing node.

BACKGROUND

1. Field

This invention relates generally to charge pump, and more specifically,to a self-biased charge pump for a phase-locked loop.

2. Background

A phase-locked loop (PLL) is a control system that generates an outputsignal whose phase is related to the phase of an input signal. The PLLis widely used in radio, telecommunications, computers and otherelectronic applications. They can be used to demodulate a signal,recover a signal from a noisy communication channel, generate a stablefrequency at multiples of an input frequency, or distribute preciselytimed clock pulses in digital logic circuits such as microprocessors.

The PLL may include a phase detector, a charge pump, a loop filter, avoltage-controlled oscillator (VCO), and a frequency divider. The VCOgenerates an output signal. The phase detector receives an input signal,compares the phase of the VCO-generated output signal with the phase ofthe input signal, and adjusts the VCO to keep the phases matched. Theoutput of the phase detector also acts as a current source to pumpcurrent into and out of the loop filter by sending UP and DN signals tothe charge pump to turn the charge pump on and off periodically. SinceUP/DN current matching in a charge-pump is important to reduce noise andspur, the charge pump uses a replica bias branch for each of the UPcircuit and the DN circuit. However, the replica bias branches addadditional noise on the charge pump.

SUMMARY

The present disclosure provides for removing the replica bias branches,and using the main branch to calibrate the UP/DN current during offstate.

In one embodiment, an apparatus is disclosed. The apparatus includes: acurrent source configured to generate current; a switching currentsource circuit coupled to the current source and a first bias node toallow the current to flow through the switching current source circuitinto the first bias node; a first bias circuit configured to receive afirst control signal from a phase detector, the first bias circuitconfigured to mirror the current flowing through the switching currentsource circuit in response to the first control signal; a second biascircuit coupled to the first bias circuit at an output node and a secondbias node, the second bias circuit configured to receive a secondcontrol signal from the phase detector; and a transconductance amplifierconfigured to receive a feedback signal from the output node andgenerate an output current to control the second biasing node.

In another embodiment, an apparatus is disclosed. The apparatusincludes: a current source configured to generate current; a switchingcurrent source circuit coupled to the current source and a first biasnode to allow the current to flow through the switching current sourcecircuit into the first bias node; a first bias circuit configured toreceive a first control signal from a phase detector, the first biascircuit configured to mirror the current flowing through the switchingcurrent source circuit in response to the first control signal; a secondbias circuit coupled to the first bias circuit at an output node and asecond bias node, the second bias circuit configured to receive a secondcontrol signal from the phase detector; and a unity gain buffer having apositive input terminal, a negative input terminal, and an outputterminal, the positive input terminal configured to receive an inputsignal, the negative input terminal coupled to the output terminal,wherein the output terminal is coupled to the output node, the firstbias circuit and the second bias circuit.

In another embodiment, a phase-locked loop is disclosed. phase-lockedloop includes: a phase detector configured to receive a reference signaland a divider output signal and output a control signal and acomplementary control signal; a charge pump including: a current sourceconfigured to generate current; a switching current source circuitcoupled to the current source and a first bias node to allow the currentto flow through the switching current source circuit into the first biasnode; a first bias circuit configured to receive a first control signalfrom a phase detector, the first bias circuit configured to mirror thecurrent flowing through the switching current source circuit in responseto the first control signal; a second bias circuit coupled to the firstbias circuit at an output node and a second bias node, the second biascircuit configured to receive a second control signal from the phasedetector; a transconductance amplifier configured to receive a feedbacksignal from the output node and generate an output current to controlthe second biasing node; a low pass filter configured to receive thecurrent pulse train signal and output a control voltage; a voltagecontrolled oscillator configured to receive the control voltage andoutput a corresponding frequency signal; and a frequency dividerconfigured receive the corresponding frequency signal and output thedivider output signal for feedback to the phase detector.

Other features and advantages of the present disclosure should beapparent from the present description which illustrates, by way ofexample, aspects of the present invention.

BRIEF DESCRIPTION OF THE DRAWINGS

The details of the present disclosure, both as to its structure andoperation, may be gleaned in part by study of the appended furtherdrawings, in which like reference numerals refer to like parts, and inwhich:

FIG. 1 is a block diagram of a phase-locked loop (PLL);

FIG. 2 is a schematic diagram of a charge pump that is one embodiment ofthe charge pump shown in FIG. 1;

FIG. 3 is a timing diagram for different configurations of the chargepump in accordance with one embodiment of the present disclosure;

FIG. 4 is a schematic diagram of a charge pump configured with replicabranches removed and UP/DN current matched using a loop gain inaccordance with one embodiment of the present disclosure;

FIG. 5A is a schematic diagram of a charge pump configured into a mainmode in accordance with one embodiment of the present disclosure;

FIG. 5B is a schematic diagram of a charge pump configured into an UP/DNcurrent calibration mode in accordance with another embodiment of thepresent disclosure; and

FIG. 5C is a schematic diagram of a charge pump configured into acurrent calibration mode using the main branch during the off state inaccordance with another embodiment of the present disclosure.

DETAILED DESCRIPTION

Certain embodiments as described herein provide for removing the replicabias branches, and using the main branch to calibrate the UP/DN currentduring off state. Since the charge pump is turned on for a very shortperiod of time due to a small phase error when the PLL is locked, theremaining time can be used by the main branch to calibrate the current.Since the main branch is used for the current calibration, there is nomatching concern between the replica and main branches. The currentmatching is only determined by the loop gain. Further, the use of themain branch to calibrate the current results in the reduction of the lowfrequency noise of the main branch, which enables the use ofsmaller-sized transistors. The detailed description set forth below isintended as a description of exemplary designs of the present disclosureand is not intended to represent the only designs in which the presentdisclosure can be practiced. The term “exemplary” is used herein to mean“serving as an example, instance, or illustration.” Any design describedherein as “exemplary” is not necessarily to be construed as preferred oradvantageous over other designs. The detailed description includesspecific details for the purpose of providing a thorough understandingof the exemplary designs of the present disclosure. It will be apparentto those skilled in the art that the exemplary designs described hereinmay be practiced without these specific details. In some instances,well-known structures and devices are shown in block diagram form inorder to avoid obscuring the novelty of the exemplary designs presentedherein.

FIG. 1 is a block diagram of a phase-locked loop (PLL) 100, whichincludes a phase detector 110, a charge pump 120, a loop filter 130, aVCO 140, a frequency divider 150, and a delta sigma modulator (DSM) 160.The VCO 140 generates an output signal. The phase detector 110 receivesa reference clock signal (f_(ref)) at its first input lead from a sourcesuch as a crystal oscillator. The phase detector 110 also receives thedivider output signal (f_(v)) at its second input lead. Using thesesignals, the phase detector 110 compares and adjusts the VCO 140 to keepthe phases matched. The phase detector 110 further generates an upcharge pump control signal (UP) and a down charge pump control signal(DN). The UP and DN signals are supplied to the charge pump 120. Thus,the output of the phase detector 110 acts as a current source to pumpcurrent into and out of the loop filter 130 using the charge pump 120 byturning the charge pump on and off periodically. The frequency divider150 divides the single-bit VCO output signal (f_(vco)) by a multi-bitdigital divisor value generated by the DSM 160, and outputs theresulting divided-down single-bit feedback signal (f_(v)) to the secondinput lead of the phase detector 110.

FIG. 2 is a schematic diagram of a charge pump 200 that is oneembodiment of the charge pump 120 of FIG. 1. In FIG. 2, the charge pump200 includes a DN current mirror circuit 240, UP current mirror circuit210, a DN replica bias circuit 260, an UP replica bias circuit 230, a DNcurrent source 228, and an UP current source 258. The charge pump outputnode 270 outputs current pulse signal I_(CP). In general, a currentmirror is a circuit block which functions to produce a copy of thecurrent in one active device by replicating the current in anotheractive device. An important feature of the current mirror is arelatively high output resistance which helps to keep the output currentconstant regardless of load conditions. Another feature of the currentmirror is a relatively low input resistance which helps to keep theinput current constant regardless of drive conditions.

The DN current mirror circuit 240 includes a DN bias circuit 242, a DNswitching current circuit 244, and a capacitor 246. The DN bias circuit242 further includes an n-channel mirror transistor 250 and an n-channelswitch transistor 252. The gate terminal of the mirror transistor 250 iscoupled to a DN bias node 256. The gate terminal of the switchtransistor 252 is controlled by the DN signal. The mirror transistor 250and the mirror transistor 254 of the DN switching current circuit 244form a current mirror. When the switch transistor 252 is turned on, thecurrent flowing from supply node 272, through current source 228, andthrough the DN switching current circuit 244, is mirrored onto the DNbias circuit 242 and current I_(DN) flows from the output node 270through the DN bias circuit 242 and to the ground node 274.

The DN replica bias circuit 260 further includes a first n-channeltransistor 262 and a second n-channel transistor 264. Transistors 262,264 form a replica bias circuit because their geometries and layout aresubstantially identical to the transistors of the DN bias circuit 242.Thus, the first transistor 262 has identical width and length dimensionsas the mirror transistor 250, and the second transistor (or switchtransistor) 264 has identical width and length dimensions as switchtransistor 252. The gate terminal of the first transistor 262 is coupledto the bias node 256 of the current mirror circuit 240. The gateterminal of the second transistor 264 is controlled by the signal DNB,which is a complementary signal to the signal DN. When the signal DNB isasserted high and the voltage at bias node 256 is sufficient to turn onthe first transistor 262, a replica current 266 flows from supply node272, through the first transistor 262, through the second transistor 264and to the ground node 274.

The UP current mirror circuit 210 includes an UP bias circuit 212, an UPswitching current circuit 214, and a capacitor 216. The UP bias circuit212 further includes a p-channel mirror transistor 222 and a p-channelswitch transistor 220. The gate terminal of the mirror transistor 222 iscoupled to an UP bias node 226. The gate terminal of the switchtransistor 220 is controlled by the UPB signal, an inverted version ofthe UP signal. The UP switching current circuit 214 further includes ap-channel mirror transistor 224. The gate terminal of the mirrortransistor 224 is coupled to the bias node 226. The mirror transistors222, 224 form a current mirror. When the switch transistor 220 is turnedon, the current flowing from the supply node 272 through the UPswitching current circuit 214 is mirrored onto the UP bias circuit 212and current I_(UP) flows from the supply node 272, through the UP biascircuit 212, and into the charge pump output node 270.

The UP replica bias circuit 230 further includes a first p-channeltransistor 234 and a second p-channel transistor 232. The firsttransistor 234 and the second transistor 232 form a replica bias circuitbecause their geometries and layout are substantially identical to thetransistors of the UP bias circuit 212. Thus, the first transistor 234has identical width and length dimensions as the mirror transistor 222,and the second transistor (or switch transistor) 232 has identical widthand length dimensions as the switch transistor 220. The source terminalof the first transistor 234 is coupled to the drain terminal of thesecond transistor 232, and the drain terminal of the first transistor234 is coupled to ground node 274. The gate terminal of the firsttransistor 234 is coupled to the bias node 226 of the current mirrorcircuit 210. The source terminal of the second transistor 232 is coupledto supply node 272. The gate terminal of the second transistor 232 iscontrolled by the UP signal. When the UP signal transitions from a highdigital logic level to a low digital logic level, and the voltage atbias node 226 is sufficiently low to turn on the first transistor 234, areplica current 236 flows from the supply node 272, through the secondtransistor 232, through the first transistor 234 and to the ground node274. Although FIG. 2 shows all transistors in the DN current mirrorcircuit 240 and the DN replica bias circuit 260 as n-channel metal oxidesemiconductor field-effect transistors (MOSFETs), while all transistorsin the UP current mirror circuit 210 and the UP replica bias circuit 230as p-channel MOSFETs, the circuits 210, 230, 240, 260 can be configuredwith any combination of n-channel and p-channel MOSFETs or other typesof transistors.

In operation, when the DN signal goes high, the current I_(DN) is madeto flow through the DN bias circuit 242. The magnitude of the currentI_(DN) is set by the current flowing through current source 228. Whenthe current flows through the DN current mirror circuit 240, there areperturbations on the DN bias node 256, and when the current stopsflowing through the DN current mirror circuit 240, there are otherperturbations. By providing the DN replica bias circuit 260 thatswitches in an opposite fashion to the DN current mirror circuit 240,where the transistors of the DN replica bias circuit 260 are replicas ofcorresponding transistors in the DN bias circuit 242, the voltagedisturbance caused by turning on the DN current mirror circuit 240 arecounteracted by opposite voltage disturbances when the DN replica biascircuit 260 is turned off. Similarly, the UP replica bias circuit 230tends to counteract voltage disturbances on the UP bias node 226 causedby switching the UP current mirror circuit 210. Thus, the replica biascircuits 260, 230 are provided to reduce the effect of these voltagedisturbances on the bias nodes 256, 226. However, the replica biasbranches add additional noise on the charge pump.

Accordingly, in some embodiments, the replica bias branches can beremoved and the main branch is used to calibrate the UP/DN current.Since the charge pump is turned on for a very short period of time dueto a small phase error when the PLL is locked, the remaining time can beused by the main branch to calibrate the current. Since the main branchis used for the current calibration, there is no matching concernbetween replica and main branch. The current matching is only determinedby the loop gain. Further, the use of the main branch to calibrate thecurrent results in the reduction of the low frequency noise of the mainbranch, which enables the use of smaller size transistors.

FIG. 3 is a timing diagram 300 for different configurations of thecharge pump in accordance with one embodiment of the present disclosure.The timing diagram 300 of FIG. 3 shows that when the UP/DN signal 310transitions from a high digital logic level to a low digital logiclevel, Φ1 signal 320 is asserted to configure the charge pump into amain mode using the main branch. When the UP/DN signal 310 is at a highdigital logic level and Φ1 signal 320 is not asserted, the charge pumpis configured into an UP/DN current calibration mode (see 330) using theI_(UP/DN) calibration branch. Further, when the charge pump is not inthe main mode or the UP/DN current calibration mode, the charge pump isplaced into an off mode as shown by Φ2 signal 340. As stated above, thecharge pump can use the main branch during this off mode (with Φ2 signalasserted) to further calibrate the UP/DN current.

FIG. 4 is a schematic diagram of a charge pump 400 configured withreplica branches (shown in FIG. 2) removed and the UP/DN current matchedusing a loop gain in accordance with one embodiment of the presentdisclosure. In various embodiments, the charge pump 400 is configuredinto a dynamic calibration circuit having a calibration loop using aV_(tune) signal. In this configuration, the current matching is onlydetermined by the loop gain. Further, dynamically calibrating thecurrent provides improved PLL references spurs and reduced in-bandcharge pump noise.

In FIG. 4, the UP switching current circuit 214, the UP current source258, the UP replica bias circuit 230, and the DN replica bias circuit260 shown in FIG. 2 are removed. Thus, in the illustrated embodiment ofFIG. 4, the operational transconductance amplifier (OTA) 410 is used tocalibrate the current at the UP bias node 226. Further, switches 450,452, 420, 426, 428, 430, a capacitor 422, and a unity gain buffer 440are used to configure the feedback signals V_(tune) and f_(b), which areinput to the OTA 410. The unity gain buffer 440 is configured as aunity-gain voltage follower with a tuning voltage (V_(tune)) as aninput. Switches 450, 452 are controlled by UPB and DNB signals,respectively. Switches 420, 426 are controlled by two complementarysignals Φ1 and Φ1, respectively. As stated above, Φ1 signal is assertedwhen the UP/DN signal 310 transitions from a high digital logic level toa low digital logic level. Switches 430, 428 are controlled by twocomplementary signals Φ2 and Φ2. As shown in the timing diagram of FIG.3, Φ2 signal is asserted when the charge pump is neither in the mainmode (Φ1 signal asserted) nor in the UP/DN current calibration mode tofurther calibrate the UP/DN current during the off mode.

FIG. 5A is a schematic diagram of a charge pump 500 configured into amain mode in accordance with one embodiment of the present disclosure.From FIG. 4, the charge pump is configured into this mode by assertingΦ1 signal (and Φ2 signal) and de-asserting Φ2 signal (and Φ1 signal).That is, switches 420 and 428 are closed, while switches 426 and 430 areopen. Switches 450 and 452 are also open. Accordingly, in this mode, thecharge pump 500 outputs current at the output node 270 by controllingcurrents I_(UP) and I_(DN) using UPB and DN signals received at theswitch transistors 220 and 252, respectively.

FIG. 5B is a schematic diagram of a charge pump 520 configured into anUP/DN current calibration mode in accordance with another embodiment.From FIG. 4, the charge pump is configured into this mode byde-asserting both Φ1 and Φ2 signals (and asserting both Φ1 and Φ2signal). That is, switches 420 and 430 are open, while switches 426 and428 are closed. Switches 450 and 452 are also open. Accordingly, in thismode, the charge pump 520 is configured to calibrate the UP/DN currentand the UP bias node 226 using the OTA 410 with the feedback of theoutput current at node 270.

FIG. 5C is a schematic diagram of a charge pump 530 configured into acurrent calibration mode using the main branch during the off state inaccordance with another embodiment of the present disclosure. From FIG.4, the charge pump is configured into this mode by asserting Φ2 signal(and Φ1 signal) and de-asserting Φ1 signal (and Φ2 signal). That is,switches 420 and 428 are open, while switches 426 and 430 are closed.Switches 450 and 452 are also closed. Accordingly, in this mode, thecharge pump 530 is configured to further calibrate the UP/DN currentusing a unity gain buffer 440 to compensate for the leakage of themirror transistors 222, 250.

Although several embodiments of the present disclosure are describedabove, many variations of the present disclosure are possible. Forexample, although the illustrated embodiments described above configurethe charge pump with transistors and capacitors, other elements such asbuffers, operational amplifiers, and switches can be used to configurethe charge pump. Further, features of the various embodiments may becombined in combinations that differ from those described above.Moreover, for clear and brief description, many descriptions of thesystems and methods have been simplified. Many descriptions useterminology and structures of specific standards. However, the disclosedsystems and methods are more broadly applicable.

Those of skill will appreciate that the various illustrative blocks andmodules described in connection with the embodiments disclosed hereincan be implemented in various forms. Some blocks and modules have beendescribed above generally in terms of their functionality. How suchfunctionality is implemented depends upon the design constraints imposedon an overall system. Skilled persons can implement the describedfunctionality in varying ways for each particular application, but suchimplementation decisions should not be interpreted as causing adeparture from the scope of the present disclosure. In addition, thegrouping of functions within a module, block, or step is for ease ofdescription. Specific functions or steps can be moved from one module orblock without departing from the present disclosure.

The various illustrative logical blocks, units, steps, components, andmodules described in connection with the embodiments disclosed hereincan be implemented or performed with a processor, such as a generalpurpose processor, a digital signal processor (DSP), an applicationspecific integrated circuit (ASIC), a field programmable gate array(FPGA) or other programmable logic device, discrete gate or transistorlogic, discrete hardware components, or any combination thereof designedto perform the functions described herein. A general-purpose processorcan be a microprocessor, but in the alternative, the processor can beany processor, controller, microcontroller, or state machine. Aprocessor can also be implemented as a combination of computing devices,for example, a combination of a DSP and a microprocessor, a plurality ofmicroprocessors, one or more microprocessors in conjunction with a DSPcore, or any other such configuration. Further, circuits implementingthe embodiments and functional blocks and modules described herein canbe realized using various transistor types, logic families, and designmethodologies.

The above description of the disclosed embodiments is provided to enableany person skilled in the art to make or use the invention described inthe present disclosure. Various modifications to these embodiments willbe readily apparent to those skilled in the art, and the genericprinciples described herein can be applied to other embodiments withoutdeparting from the spirit or scope of the present disclosure. Thus, itis to be understood that the description and drawings presented hereinrepresent presently preferred embodiments of the present disclosure andare therefore representative of the subject matter which is broadlycontemplated by the present disclosure. It is further understood thatthe scope of the present disclosure fully encompasses other embodimentsthat may become obvious to those skilled in the art and that the scopeof the present disclosure is accordingly limited by nothing other thanthe appended claims.

The invention claimed is:
 1. An apparatus comprising: a current sourceconfigured to generate current; a switching current source circuitcoupled to the current source and a first bias node to allow the currentto flow through the switching current source circuit into the first biasnode; a first bias circuit configured to receive a first control signalfrom a phase detector, the first bias circuit configured to mirror thecurrent flowing through the switching current source circuit in responseto the first control signal; a second bias circuit coupled to the firstbias circuit at an output node and a second bias node, the second biascircuit configured to receive a second control signal from the phasedetector; and a transconductance amplifier configured to receive afeedback signal from the output node and generate an output current tocontrol the second biasing node.
 2. The apparatus of claim 1, whereinthe apparatus is a charge pump of a phase-locked loop.
 3. The apparatusof claim 1, wherein the first control signal is a down signal to drawthe current out of the output node.
 4. The apparatus of claim 1, whereinthe second control signal is a complementary up signal to pump thecurrent into the output node.
 5. The apparatus of claim 1, wherein theswitching current source circuit comprises a first transistor configuredwith a gate terminal coupled to the first bias node, a drain terminalcoupled to the current source and the gate terminal, and a sourceterminal coupled to a ground voltage.
 6. The apparatus of claim 5,further comprising a first capacitor coupled to the gate terminal of thefirst transistor and the ground voltage.
 7. The apparatus of claim 6,wherein the first bias circuit comprises a second transistor and a thirdtransistor, wherein the second and third transistors are configured withn-channel metal oxide semiconductor field-effect transistors (MOSFETs).8. The apparatus of claim 7, wherein the second transistor is configuredwith a drain terminal coupled to the output node and a gate terminalcoupled to the first bias node.
 9. The apparatus of claim 8, wherein thethird transistor is configured with a gate terminal to receive the firstcontrol signal, a drain terminal coupled to a source terminal of thesecond transistor, and a source terminal coupled to the ground voltage.10. The apparatus of claim 9, wherein the second bias circuit comprisesa fourth transistor and a fifth transistor, wherein the fourth and fifthtransistors are configured with p-channel MOSFETs.
 11. The apparatus ofclaim 10, wherein the fourth transistor is configured with a gateterminal coupled to the second bias node and a drain terminal coupled tothe output node.
 12. The apparatus of claim 11, wherein the fifthtransistor is configured with a gate terminal to receive the secondcontrol signal, a drain terminal coupled to a source terminal of thefourth transistor, and a source terminal coupled to a supply voltage.13. The apparatus of claim 12, further comprising a second capacitorcoupled to the second bias node and the supply voltage.
 14. Anapparatus, comprising: a current source configured to generate current;a switching current source circuit coupled to the current source and afirst bias node to allow the current to flow through the switchingcurrent source circuit into the first bias node; a first bias circuitconfigured to receive a first control signal from a phase detector, thefirst bias circuit configured to mirror the current flowing through theswitching current source circuit in response to the first controlsignal; a second bias circuit coupled to the first bias circuit at anoutput node and a second bias node, the second bias circuit configuredto receive a second control signal from the phase detector; and a unitygain buffer having a positive input terminal, a negative input terminal,and an output terminal, the positive input terminal configured toreceive an input signal, the negative input terminal coupled to theoutput terminal, wherein the output terminal is coupled to the outputnode, the first bias circuit and the second bias circuit.
 15. Theapparatus of claim 14, wherein the first bias circuit comprises a secondtransistor and a third transistor, wherein the second and thirdtransistors are configured with n-channel MOSFETs.
 16. The apparatus ofclaim 15, wherein the output terminal of the unity gain buffer iscoupled to a source terminal of the second transistor and a drainterminal of the third transistor.
 17. The apparatus of claim 14, whereinthe second bias circuit comprises a fourth transistor and a fifthtransistor, wherein the fourth and fifth transistors are configured withp-channel MOSFETs.
 18. The apparatus of claim 17, wherein the outputterminal of the unity gain buffer is coupled to a source terminal of thefourth transistor and a drain terminal of the fifth transistor.
 19. Aphase-locked loop, comprising: a phase detector configured to receive areference signal and a divider output signal and output a control signaland a complementary control signal; a charge pump comprising: a currentsource configured to generate current; a switching current sourcecircuit coupled to the current source and a first bias node to allow thecurrent to flow through the switching current source circuit into thefirst bias node; a first bias circuit configured to receive a firstcontrol signal from a phase detector, the first bias circuit configuredto mirror the current flowing through the switching current sourcecircuit in response to the first control signal; a second bias circuitcoupled to the first bias circuit at an output node and a second biasnode, the second bias circuit configured to receive a second controlsignal from the phase detector; a transconductance amplifier configuredto receive a feedback signal from the output node and generate an outputcurrent to control the second biasing node; a low pass filter configuredto receive the current pulse train signal and output a control voltage;a voltage controlled oscillator configured to receive the controlvoltage and output a corresponding frequency signal; and a frequencydivider configured receive the corresponding frequency signal and outputthe divider output signal for feedback to the phase detector.
 20. Thephase-locked loop of claim 19, wherein the first bias circuit is a DNbias circuit and the second bias circuit is an UP bias circuit.